Wellman Center Lecture Series

July 11, 2017
12:00pm-1:00pm

Massachusetts General Hospital
50 Blossom Street, 1st Floor, Thier Conference Room
Boston, MA 02114

"How non-diffuse scattering characterizes superficial lesions"

Steven L. Jacques, PhD
Professor, Depts. of Biomedical Engineering & Dermatology
Oregon Health & Science University
Portland, OR

Bio:
Steven L. Jacques received a B.S. degree in Biology at M.I.T., and an M.S. degree in Electrical Engineering and Computer Science and a Ph.D. degree in Biophysics and Medical Physics from the University of California-Berkeley. In 1983, he joined the Wellman Laboratory for Photomedicine at MGH, rising to a Lecturer in Dermatology/Bioengineering, Harvard Medical School. In 1988, he joined the University of Texas M. D. Anderson Cancer as an Assistant Professor of Urology/Biophysics, and later as a tenured Assoc. Professor. In 1996, he moved to Oregon and is now Professor of Biomedical Engineering & Dermatology at Oregon Health & Science University. In September 2017, he will join Tufts University in Biomedical Engineering.

Abstract:
Optically detecting structural abnormalities in epithelia can be based on the light-scattering properties of the tissue. Confocal methods such as confocal reflectance and optical coherence tomography can characterize a tissue using reflectivity (rho) and attenuation (mu) as contract parameters. Optical fiber probes that contact a tissue can be sensitive to superficial tissue structure. Telecentric cameras can survey broader areas of tissue while controlling their sensitivity to tissue depth. Underlying the interpretation of such measurements is the assumed behavior of the angular scattering pattern from a single photon-scattering event. The angular scattering can be described in terms of the anisotropies g1 and g2, which describe the balance between forward vs backward scattering (g1) and the balance between narrow vs broad scattering (g2). This talk discusses how submicron structure (10-1000 nm) influences angular scattering and hence affects such optical measurements.